glc002-firmware/zb_afTestCb.c

145 lines
3.8 KiB
C

/********************************************************************************************************
* @file zb_afTestCb.c
*
* @brief This is the source file for zb_afTestCb
*
* @author Zigbee Group
* @date 2021
*
* @par Copyright (c) 2021, Telink Semiconductor (Shanghai) Co., Ltd. ("TELINK")
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*******************************************************************************************************/
#if (__PROJECT_TL_DIMMABLE_LIGHT__)
/**********************************************************************
* INCLUDES
*/
#include "tl_common.h"
#include "zb_api.h"
#include "zcl_include.h"
#include "sampleLight.h"
#if ZBHCI_EN
#include "zbhci.h"
#endif
#if AF_TEST_ENABLE
/**********************************************************************
* LOCAL CONSTANTS
*/
/**********************************************************************
* TYPEDEFS
*/
/**********************************************************************
* LOCAL FUNCTIONS
*/
/**********************************************************************
* GLOBAL VARIABLES
*/
/**********************************************************************
* LOCAL VARIABLES
*/
u16 g_afTest_rcvReqCnt = 0;
/**********************************************************************
* FUNCTIONS
*/
static void afTest_testReqPrc(apsdeDataInd_t *pApsdeInd)
{
epInfo_t dstEp;
TL_SETSTRUCTCONTENT(dstEp, 0);
dstEp.dstEp = pApsdeInd->indInfo.src_ep;
dstEp.profileId = pApsdeInd->indInfo.profile_id;
dstEp.dstAddrMode = APS_SHORT_DSTADDR_WITHEP;
dstEp.dstAddr.shortAddr = pApsdeInd->indInfo.src_short_addr;
u8 dataLen = 50;
u8 *pBuf = (u8 *)ev_buf_allocate(dataLen);
if (pBuf)
{
u8 *pData = pBuf;
*pData++ = LO_UINT16(g_afTest_rcvReqCnt);
*pData++ = HI_UINT16(g_afTest_rcvReqCnt);
for (u8 i = 0; i < dataLen - 2; i++)
{
*pData++ = i;
}
u8 apsCnt = 0;
#if ZBHCI_EN
zbhciTx(ZCL_CLUSTER_TELINK_SDK_TEST_RSP, pApsdeInd->asduLen, (u8 *)pApsdeInd->asdu);
#else
af_dataSend(pApsdeInd->indInfo.dst_ep, &dstEp, ZCL_CLUSTER_TELINK_SDK_TEST_RSP, dataLen, pBuf, &apsCnt);
#endif
ev_buf_free(pBuf);
}
}
static void afTest_testClearReqPrc(apsdeDataInd_t *pApsdeInd)
{
epInfo_t dstEp;
TL_SETSTRUCTCONTENT(dstEp, 0);
dstEp.dstEp = pApsdeInd->indInfo.src_ep;
dstEp.profileId = pApsdeInd->indInfo.profile_id;
dstEp.dstAddrMode = APS_SHORT_DSTADDR_WITHEP;
dstEp.dstAddr.shortAddr = pApsdeInd->indInfo.src_short_addr;
u8 st = SUCCESS;
u8 apsCnt = 0;
af_dataSend(pApsdeInd->indInfo.dst_ep, &dstEp, ZCL_CLUSTER_TELINK_SDK_TEST_CLEAR_RSP, 1, &st, &apsCnt);
}
void afTest_rx_handler(void *arg)
{
apsdeDataInd_t *pApsdeInd = (apsdeDataInd_t *)arg;
switch (pApsdeInd->indInfo.cluster_id)
{
case ZCL_CLUSTER_TELINK_SDK_TEST_CLEAR_REQ:
g_afTest_rcvReqCnt = 0;
afTest_testClearReqPrc(pApsdeInd);
break;
case ZCL_CLUSTER_TELINK_SDK_TEST_REQ:
g_afTest_rcvReqCnt++;
afTest_testReqPrc(pApsdeInd);
break;
case ZCL_CLUSTER_TELINK_SDK_TEST_RSP:
break;
default:
break;
}
/* Must be free here. */
ev_buf_free((u8 *)arg);
}
void afTest_dataSendConfirm(void *arg)
{
// apsdeDataConf_t *pApsDataCnf = (apsdeDataConf_t *)arg;
}
#endif /* AF_TEST_ENABLE */
#endif /* __PROJECT_TL_DIMMABLE_LIGHT__ */